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Ferroelectric Random Access Memories: Fundamentals and...

Ferroelectric Random Access Memories: Fundamentals and Applications

James F. Scott (auth.), Prof. Hiroshi Ishiwara, Prof. Masanori Okuyama, Dr. Yoshihiro Arimoto (eds.)
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In fabrication of FeRAMs, various academic and technological backgrounds are necessary, which include ferroelectric materials, thin film formation, device physics, circuit design, and so on.This book covers from fundamentals to applications of ferroelectric random access memories (FeRAMs). The book consists of 5 parts; (1) ferroelectric thin films, (2) deposition and characterization methods, (3) fabrication process and circuit design, (4) advanced-type memories, and (5) applications and future prospects, and each part is further devided in several chapters. Because of the wide range of the discussed topics, each chapter in this book was written by one of the best authors knowing the specific topic very well. Thus, this is a good introduction book of FeRAM for graduate students and new comers to this field, as well as it helps specialists to understand FeRAMs more deeply.

种类:
年:
2004
出版:
1
出版社:
Springer-Verlag Berlin Heidelberg
语言:
english
页:
291
ISBN 10:
3540451633
ISBN 13:
9783540451631
系列:
Topics in Applied Physics 93
文件:
PDF, 7.08 MB
IPFS:
CID , CID Blake2b
english, 2004
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